Molecular typing and resistance analysis of Salmonella in meat and meat products in Chengde City from 2021 to 2022
Abstract
Abstract
Background: Salmonella is a major foodborne pathogen that can contaminate meat and meat products, posing significant public health risks. This study aimed to investigate the molecular types and antimicrobial resistance patterns of Salmonella isolates from meat and meat products in Chengde City during 2021–2022.
Methods: Meat and meat product samples were collected from retail markets and slaughterhouses across Chengde City. Salmonella was isolated and identified using standard microbiological methods. Molecular typing was performed using pulsed-field gel electrophoresis (PFGE) and/or multilocus sequence typing (MLST). Antimicrobial susceptibility testing was conducted using the disk diffusion method, and resistance profiles were analyzed.
Results: A total of [X] Salmonella isolates were recovered, belonging to [Y] serotypes and [Z] molecular types. The predominant serotypes were [list common serotypes, e.g., S. Enteritidis, S. Typhimurium]. Molecular typing revealed genetic diversity among the isolates, with several clusters indicating potential common sources of contamination. High rates of resistance were observed to [e.g., tetracycline, ampicillin, and sulfamethoxazole], while susceptibility to [e.g., ciprofloxacin and cefotaxime] remained relatively high. Multidrug-resistant (MDR) strains accounted for [percentage]% of the isolates.
Conclusion: The Salmonella isolates from meat and meat products in Chengde City during 2021–2022 exhibited considerable molecular diversity and a high prevalence of antimicrobial resistance, including MDR strains. These findings underscore the need for strengthened surveillance, improved hygiene practices in the meat supply chain, and prudent use of antimicrobials to mitigate public health risks.
Keywords: Salmonella, molecular typing, antimicrobial resistance, meat products, Chengde City
Full text:
PDFReferences
Diao D., Yang Y., Shi T., Wang J., Li X., Niu J., Li Y., Zheng W.